Self-testing measuring system

US11313967B2 · kind B2 · utility

Assignee

• ELMOS SEMICONDUCTOR SE · DE

Inventors

• Andre Schmidt · Herzogenaurach, DE
• Guido Schlautmann · Altenberge, DE
• Stefanie Heppekausen · Essen, DE

Key dates

• Filing date: Nov 30, 2020
• Grant date: Apr 26, 2022
• Expiry date: Nov 30, 2040

Classification

• Technology area (CPC G): Physics
• CPC primary: G01S7/4073
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A self-testing measuring system includes at least three modes: an operating mode and at least two test modes. In a third test mode, a digital signal generating unit stimulates the digital input circuit directly by means of test signals. In a second test mode, the digital signal generating unit stimulates the analogue signal string and the digital input circuit by means of test signals. In a first test mode, the digital signal generating unit stimulates the analogue signal string, the measuring unit (typically an ultrasound transducer) and the digital input circuit by means of test signals, thereby allowing this signal string to be tested. In the operating mode, the digital signal generating unit stimulates the analogue signal string, the measuring unit (typically an ultrasound transducer) and the digital input circuit by means of output signals, thereby allowing the signal string to be monitored for parameter compliance.