User-interactive defect analysis for root cause

US11314721B1 · kind B1 · utility

Assignee

• Palantir Technologies Inc. · US

Inventors

• Jason Ma · Palo Alto, US
• Allen Cai · Menlo Park, US
• Andrew Cooper · Chicago, US
• Arnaud Drizard · Paris, FR
• Benjamin Lee · Palo Alto, US
• Damien Cramard · Paris, FR
• Damian Rusak · London, GB
• Hind Kraytem · London, GB
• Jan Matas · London, GB
• Ludovic Lay · Paris, FR
• Myles Scolnick · New York, US
• Radu-Andrei Szasz · London, GB
• Stefan Negrus · Washington, US
• Taylor Cathcart · New York, US
• Zhixian Shen · New York, US

Key dates

• Filing date: Mar 22, 2018
• Grant date: Apr 26, 2022
• Expiry date: Jun 27, 2040

Classification

• Technology area (CPC G): Physics
• CPC primary: G06F16/252
• WIPO field: Computer technology
• WIPO sector: Electrical engineering

Abstract

Systems are provided for managing defect data objects. A system stores a plurality of defect data objects that have been input to the system, and generates an issue item including one or more defect data objects that are selected from the stored defect data objects based on user input. The system determines similarity between the one or more defect data objects in the issue item and one or more of the stored defect data objects that are out of the issue item, based on comparison of one or more parameter values. The system determines one or more candidate defect data objects to be included in the issue item from the one or more of the stored defect data objects that are out of the issue item based on the similarity, and includes one or more of the determined candidate defect data objects in the issue item based on user input.