Piecewise calibration for highly non-linear multi-stage analog-to-digital converter
US11316526B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 18, 2020 |
| Grant date | Apr 26, 2022 |
| Priority date | — |
| Expiry date | Dec 18, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K5/24
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
An analog-to-digital converter includes a voltage-to-delay device, such as a pre-amplifier array, for generating a delay signal based on a first voltage, and delay-based stages for generating digital signals based on the delay signal. In operation, the delay signal is transmitted to a first delay-based stage, or to an intermediate delay-based stage, bypassing the first delay-based stage, to overcome non-linearity of previous stages. If desired, different pre-amplifiers may be used to generate signals for calibration of different delay-based stages. The present disclosure may also involve converting to pseudo-static signals before signals are handed over to a calibration engine, to ease timing and preserve interface area and power. If desired, simple delay elements may be used to correct for non-linearity in a delay-based analog-to-digital converter. The present disclosure may be employed, if desired, in connection with any suitable cascade of non-linear stages.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.