Patent · US Active

Bit error rate determination method and measurement instrument

US11316768B2 · kind B2 · utility

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18Claims

0Family size

Assignee

Rohde & Schwarz GmbH & Co. KG · DE

Inventors

Bernhard Nitsch · Birkenfeld, DE
Adrian Ispas · Munich, DE

Key dates

Filing date	Jan 23, 2020
Grant date	Apr 26, 2022
Priority date	—
Expiry date	Jan 23, 2040

Classification

Technology area (CPC H)Electricity
CPC primaryH04L43/0847
WIPO fieldDigital communication
WIPO sectorElectrical engineering

Abstract

A bit error rate determination method for determining a bit error rate of an input signal is described, wherein the input signal is generated by a signal source, comprising: at least one of receiving and generating a first histogram of a time interval error associated with a first bounded jitter component of the input signal; at least one of receiving and generating random jitter data comprising information on a time interval error associated with a random jitter component of the input signal; and determining the bit error rate based on at least one of the first histogram and the random jitter data. Further, a measurement instrument is described.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.