Patent · US Active

Intelligent defect identification system

US11320385B2 · kind B2 · utility

2Cited by

12References

20Claims

0Family size

Assignee

Seagate Technology LLC · US

Inventors

Kurtis Dean Loken · Bloomington, US
Zhiyu Chen · Longbeilingcun, CN
Gary J. Kunkel · Minneapolis, US

Key dates

Filing date	Oct 16, 2018
Grant date	May 3, 2022
Priority date	—
Expiry date	Nov 17, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG06T2207/20081
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Various defects in an electronic assembly can be intelligently identified with a system having at least a server connected to a first capture module and a second capture module. The first capture module may be positioned proximal a first manufacturing line while the second capture module is positioned proximal a second manufacturing line. Images can be collected of first and second electronic assemblies by respective first and second capture modules prior to the images being sent to a classification module of the server where at least one defect is automatically detected in each of the first and second electronic assemblies concurrently with the classification module.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.