Generating metrics values at component levels of a monolithic application and of a microservice of a microservices-based architecture
US11321217B1 · kind B1 · utility
6Cited by
12References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 6, 2020 |
| Grant date | May 3, 2022 |
| Priority date | — |
| Expiry date | Oct 6, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/865
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Monitoring and troubleshooting tools provide the capability to visualize different levels of a client's application that is deployed as a suite of independent but cooperating services (e.g., an application that includes a monolithic application and a microservices-based application), collect values of monitored or tracked metrics at those different levels, and visualize values of the metrics at those levels. For example, metrics values can be generated for components of the monolithic application and/or for components of a microservice of the microservice-based application.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.