Patent · US Active

Test system and test method

US11323352B2 · kind B2 · utility

0Cited by

17References

18Claims

0Family size

Assignee

Rohde & Schwarz GmbH & Co. KG · DE

Inventors

Mahmud Naseef · Planegg, DE
Christian Reimer · Wellesley, US

Key dates

Filing date	Jan 30, 2019
Grant date	May 3, 2022
Priority date	—
Expiry date	Feb 20, 2039

Classification

Technology area (CPC H)Electricity
CPC primaryH04B7/0617
WIPO fieldTelecommunications
WIPO sectorElectrical engineering

Abstract

System and method for testing a device under test via a wireless communication link. When testing the device under test, an interference signal may be applied to the test scenario. The generation of the interference signal may be controlled based on a monitoring of a frequency spectrum in the test scenario, in particular a frequency spectrum at the device under test. In this way, a more realistic test scenario can be achieved.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.