Determining defects having a characteristic separation distance
US11323574B2 · kind B2 · utility
0Cited by
6References
20Claims
0Family size
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Key dates
| Filing date | Sep 25, 2020 |
| Grant date | May 3, 2022 |
| Priority date | — |
| Expiry date | Sep 25, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N1/00045
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A first separation distance is determined between a first pair of defects in a scanned image of a first printed sheet, and a second separation distance is determined between a second pair of defects in a scanned image of a second printed sheet. The defects are determined as having a separation distance in that the first and second separation distances are each within a first threshold of a specified separation distance and/or a difference between the first and second separation distances is below a second threshold. A source of the defects can be determined based on the characteristic separation distance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.