Patent · US Active

Automatic testing system and method

US11327108B2 · kind B2 · utility

0Cited by

1References

19Claims

0Family size

Assignee

WISTRON CORPORATION · TW

Inventors

Hsiang-Yu Chen · Changli, CN
Po-Ju Lin · New Taipei, TW

Key dates

Filing date	May 26, 2020
Grant date	May 10, 2022
Priority date	—
Expiry date	Jul 30, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2825
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An automatic testing system includes a platform; a carrier fixed on a surface of the platform for carrying a device under test (DUT); a function test module for testing functions of the DUT; and a shifting module for shifting the function test module.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.