Memory module storing test pattern information, computer system comprising the same, and test method thereof
US11328786B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Feb 4, 2020 |
| Grant date | May 10, 2022 |
| Priority date | — |
| Expiry date | Aug 27, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/3602
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A memory module includes at least one semiconductor memory device, and a test pattern memory that stores first test pattern information for testing the at least one semiconductor memory device, and the first test pattern information stored in the test pattern memory is transferred to a host in a test operation. Through the memory module having the above-described function, a memory test is possible in consideration of a unique weak characteristic of the memory module.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.