Two-dimensional diffraction grating atomic interferometer and atomic interferometry method
US11328829B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 9, 2021 |
| Grant date | May 10, 2022 |
| Priority date | — |
| Expiry date | Apr 9, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B27/28
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is an atomic interferometer including a source of atoms, a laser source and a magnetic field generating device, a polarizer, a system for adjusting a detuning between two optical frequencies of the incident laser beam, a two-dimensional diffraction grating arranged in such a way as to receive the incident laser beam and to form by diffraction at least three diffracted beams, a controller configured to select a combination of an optical frequency detuning, a polarization state and a magnetic field, the combination being adapted to select a first pair of laser beams among the pairs of beams formed from the incident laser beam and the diffracted beams, the pair of laser beams being applied in such a way as to interact with the cloud of atoms by multi-photon transitions and to detect an acceleration of the cloud of atoms along a measurement direction.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.