Determining aberrant members of a homogenous cluster of systems using external monitors
US11334410B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Jul 22, 2019 |
| Grant date | May 17, 2022 |
| Priority date | — |
| Expiry date | Nov 5, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/81
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Certain aspects of the present disclosure provide techniques for detecting and preventing failures in a cluster of systems. Embodiments include receiving a set of performance metrics from each respective system of the cluster of systems. Embodiments include determining a score for each respective system of the cluster of systems based on the set of performance metrics received from the respective system. Embodiments include comparing the score for each respective system of the cluster of systems to a threshold. Embodiments include identifying, based on the comparing, an aberrant system of the cluster of systems. Embodiments include performing a remedial action on the aberrant system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.