Patent · US Active

Integrated circuit facilitating subsequent failure analysis and methods useful in conjunction therewith

US11334447B2 · kind B2 · utility

0Cited by
5References
14Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 27, 2020
Grant dateMay 17, 2022
Priority date
Expiry dateAug 27, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2201/82
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A chip aka integrated circuit, the chip comprising configuration register/s, typically volatile, and/or at least one on-chip non-volatile memory m typically including at least one reserved memory location, which may be reserved for storing contents of at least one typically volatile configuration register r, from among the configuration registers; and/or apparatus configured for, at least once, storing values which may be indicative of content of at least one typically volatile configuration register r from among the registers, e.g. in the on-chip non-volatile memory m, e.g. at the at least one reserved memory location.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.