Method for image analysis
US11334762B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 29, 2019 |
| Grant date | May 17, 2022 |
| Priority date | — |
| Expiry date | Jun 19, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V20/56
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and system for synthetic data generation and analysis includes generating a synthetic dataset. A set of parameters is determined and scenarios are generated from the parameters that represent three-dimensional scenes. Synthetic images are rendered for the scenarios. A synthetic dataset may be formed to have a controlled variation in attributes of synthetic images over a synthetic dataset. The synthetic dataset may be used for training or evaluating a machine learning model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.