Method and apparatus for managing machine learning process
US11334813B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 17, 2017 |
| Grant date | May 17, 2022 |
| Priority date | — |
| Expiry date | Mar 18, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A processor obtains a first measurement value representing prediction performance of a model that has been learned by using a first parameter value and training data of first size. The processor calculates a first expected value and a first variance degree of prediction performance of a model that would be learned by using the first parameter value and training data of second size. The processor also obtains a second measurement value representing prediction performance of a model that has been learned by using a second parameter value and training data of the first size. The processor calculates a second expected value and a second variance degree of prediction performance of a model that would be learned by using the second parameter value and training data of the second size.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.