Defect gauge instrument for preparation of surgical sites
US11337830B2 · kind B2 · utility
1Cited by
11References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 12, 2019 |
| Grant date | May 24, 2022 |
| Priority date | — |
| Expiry date | Aug 10, 2040 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61F2002/4658
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
This disclosure relates to a defect gauge instrument and method for repairing bone defects. The defect gauge instrument disclosed herein may be utilized to determine one or more characteristics of a bone defect prior to positioning a graft and/or implant at a surgical site.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.