Patent · US Active

System and method for monitoring manufacturing

US11340142B2 · kind B2 · utility

1Cited by
6References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 4, 2020
Grant dateMay 24, 2022
Priority date
Expiry dateSep 4, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F16/907
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

A method includes receiving raw data and generating a manufacturing data packet (MDP) that includes at least a portion of the raw data. Generating the MDP includes associating metadata with the raw data and associating a timestamp with the raw data. The timestamp is synchronized to a common reference time. A data model associated with the MDP is obtained. The data model includes one or more predefined data types and one or more predefined data fields. A first data type from the one or more predefined data types is determined based at least in part on characteristics of the raw data. An algorithm is determined based at least in part on the first data type. The MDP is processed according to the algorithm to produce an output. The first data type is associated with the raw data. The output is associated with a data field of the first data type.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.