Stimulated Raman scattering microscope device and stimulated Raman scattering measurement method
US11340171B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 9, 2017 |
| Grant date | May 24, 2022 |
| Priority date | — |
| Expiry date | Dec 13, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/063
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A stimulated Raman scattering microscope device is configured to irradiates a sample with a first optical pulse at a first repetition frequency, to irradiate the sample with a second optical pulse of an optical frequency different from an optical frequency of the first optical pulse at a second repetition frequency, and to detect optical pulses of the first repetition frequency that are included in detected light from the sample irradiated with the first optical pulse and the second optical pulse, as a detected optical pulse train. The second optical pulse is generated by dispersing predetermined optical pulses that include lights of a plurality of optical frequencies, regulating to output optical pulses of a predetermined number of different optical frequencies out of the dispersed optical pulses at the second repetition frequency, and coupling the regulated optical pulses.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.