Patent · US Active

Calibration assembly and method for calibrating geometric parameters of CT apparatus

US11340177B2 · kind B2 · utility

0Cited by

5References

15Claims

0Family size

Assignees

NUCTECH COMPANY LIMITED · CN
TSINGHUA UNIVERSITY · CN

Inventors

Zhiqiang Chen · Beijing, CN
Li Zhang · Beijing, CN
Zhenhua Zhao · Beijing, CN
Yunda Sun · Beijing, CN
Xin Jin · Beijing, CN
Wuyang Liang · Beijing, CN

Key dates

Filing date	Jan 20, 2020
Grant date	May 24, 2022
Priority date	—
Expiry date	Jan 20, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG01V13/00
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Disclosed are calibration assembly and calibration method of calibrating geometric parameters of a CT apparatus. The calibration assembly includes at least one calibration unit each including a plurality of calibration wires, and the plurality of calibration wires are arranged regularly in a same plane. The calibration assembly is easy to be processed and can be used to calibrate geometric parameters of a CT apparatus, and the calibration operations are simple and easy to be implemented.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.