Defect resolution
US11341027B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 17, 2019 |
| Grant date | May 24, 2022 |
| Priority date | — |
| Expiry date | Jul 26, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3668
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems, methods, and non-transitory computer readable media are provided for facilitating improved defect resolution. Defect information and defect criteria information may be obtained. The defect information may identify defects of software and/or hardware in development. The defect criteria information may define one or more criteria for measuring the defects. The defects may be measured based on the one or more criteria. A defect analysis interface may be provided. The defect analysis interface may list a limited number of the defects based on the measurements of the defects. The defect analysis interface may provide costs (e.g., computing resources, time, personnel) of solving the defects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.