Patent · US Active

Calibration methods for improving uniformity in X-ray photon counting detectors

US11344266B2 · kind B2 · utility

1Cited by
4References
7Claims
0Family size

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Inventors

Key dates

Filing dateSep 14, 2020
Grant dateMay 31, 2022
Priority date
Expiry dateSep 14, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01T1/24
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Various aspects include methods for use in X-ray detectors for adjusting count measurements from pixel detectors within a pixelated detector module to correct for the effects of pileup events that occur when more than one photon is absorbed in a pixel detector during a deadtime of the detector system. In various embodiments, count measurements may be obtained at two different X-ray tube currents, from which the detector system deadtime may be calculated based on the two count measurements and a ratio of the two X-ray tube currents. Using the calculated deadtime, a pileup correction factor may be determined appropriate for the behavior of the detector system in response to pileup events. The pileup correction factor may be applied to pixel detector count values after the counts have been corrected for pixel-to-pixel differences using a flat field correction.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.