Patent · US Active

Image-based assay using intelligent monitoring structures

US11346764B2 · kind B2 · utility

1Cited by

1References

42Claims

0Family size

Assignee

Essenlix Corporation · US

Inventors

Stephen Y. Chou · Princeton, US
Wei Ding · Hefei, CN
Wu Chou · Jalan Pedongkelan, US
Jun Tian · Tualatin, US
Yuecheng Zhang · Malmö, SE
Mingquan Wu · Princeton Junction, US
Xing Li · Lexington, US

Key dates

Filing date	Aug 16, 2019
Grant date	May 31, 2022
Priority date	—
Expiry date	Aug 16, 2039

Classification

Technology area (CPC G)Physics
CPC primaryG01N2001/282
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The present invention is related to correct the errors in instruments, operation, and others using intelligent monitoring structures and machine learning, and others.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.