Patent · US Active

Signal analysis method and measurement instrument

US11346884B2 · kind B2 · utility

0Cited by
1References
20Claims
0Family size

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Key dates

Filing dateNov 22, 2019
Grant dateMay 31, 2022
Priority date
Expiry dateSep 22, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31727
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A signal analysis method is disclosed. The method comprises the following steps: An input signal comprising a symbol sequence is received, wherein the input signal is associated with a first clock signal comprising at least one jitter component. A second clock signal is recovered based on said input signal. At least one jitter parameter is determined that is associated with said at least one jitter component. A jitter signal is reconstructed based on said at least one jitter parameter, wherein said jitter signal is associated with said at least one jitter component. A third clock signal is determined based on said second clock signal and said jitter signal. Further, a measurement instrument is disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.