Patent · US Active

Device for contactless measurement of the parameters of a linear textile formation, a method of controlling the device and a textile machine

US11352720B2 · kind B2 · utility

0Cited by

6References

18Claims

0Family size

Assignee

Maschinenfabrik Rieter AG · CH

Inventors

Evzen Pilar · Litomyšl, CZ
Bernd Bahlmann · Schrobenhausen, DE

Key dates

Filing date	Feb 15, 2019
Grant date	Jun 7, 2022
Priority date	—
Expiry date	Mar 2, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG01N21/952
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A device for contactless measurement of one or more parameters of a linear textile formation (e.g., yarn) includes a yarn sensor with at least two mutually independent detection zones for one or a combination of the parameters of yarn presence, yarn movement, or yarn quality. The individual detections zones are arranged in defined positions relative to at least two different yarn paths of the yarn at a workstation depending on changed states of the yarn at the workstation so that at least one of the parameters is measured in each of the detections zones.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.