Patent · US Active

Method for testing a device under test

US11353510B1 · kind B1 · utility

0Cited by

1References

16Claims

0Family size

Assignee

Endress+Hauser Flowtec AG · CH

Inventors

Jerry E. Stevens · Brownsburg, US
Hao Zhu · Freising, DE
Marcel Braun · Konolfingen, CH

Key dates

Filing date	Dec 28, 2020
Grant date	Jun 7, 2022
Priority date	—
Expiry date	Dec 28, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG01F1/84
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for testing a device under test, the device under test being a measuring instrument to measure a physical parameter of a fluid, includes: performing a plurality of valid test runs, wherein a valid test run includes: exposing the device under test and a reference measuring instrument to the fluid under a set of influences, the set of influences being defined by influence parameters; monitoring the influence parameters; obtaining a reference value for the physical parameter from the reference measuring instrument; and obtaining a test value for the physical parameter from the device under test, wherein a test run is invalidated if influence parameters do not meet specified test requirements for the influence parameters; and then evaluating a plurality of test values originating from the plurality of valid test runs with respect to at least one of accuracy, repeatability and reproducibility.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.