Patent · US Active

Semiconductor chip scale package and method

US11355446B2 · kind B2 · utility

0Cited by
0References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 16, 2019
Grant dateJun 7, 2022
Priority date
Expiry dateMar 23, 2040

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2223/54486
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The present disclosure relates to a semiconductor chip scale package including a semiconductor die. The semiconductor die has a first major surface opposing a second major surface, a plurality of side walls extending between the first major surface and second major surface, a plurality of electrical contacts arranged on the second major surface of the semiconductor die, and an insulating material disposed on the plurality of side walls and on the first major surface. The insulating material includes a machine readable identifier by which a semiconductor chip scale packaging type is identifiable by an identification apparatus that reads the machine readable identifier, and the machine readable identifier includes a colour component.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.