Tilted slit confocal system configured for automated focus detection and tracking
US11356594B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 17, 2020 |
| Grant date | Jun 7, 2022 |
| Priority date | — |
| Expiry date | Nov 11, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/16
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for automated focus tracking of a sample is disclosed. The system comprises an illumination source, a set of illumination optics in an illumination path, a set of collection optics in a collection path, a first slit device in the illumination path, a second slit device in the collection path, at least one detector configured to generate an image of the sample, and a controller configured to receive through-focus information from the image, and provide corrective motion to a stage holding the sample to maintain a position of the sample at a selected focus. A method for automated focus tracking of a sample is also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.