Test system and testing method
US11356875B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 29, 2020 |
| Grant date | Jun 7, 2022 |
| Priority date | — |
| Expiry date | Sep 29, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/17
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A test system for testing a device under test is described. The test system includes a testing module and the device under test. The testing module is configured to establish a wireless connection with the device under test based on a wireless communication standard having a low energy protocol. The wireless connection includes a control channel and at least one test channel. The control channel is configured to transmit at least one control message between the testing module and the device under test. The at least one test channel is configured to transmit data packages between the testing module and the device under test, wherein an RF level of the control channel is higher than an RF level of the at least one test channel. Further, a testing method for testing a device under test is described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.