Measurement arrangement for detecting aging processes in individual light-emitting diodes
US11357088B2 · kind B2 · utility
0Cited by
10References
11Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Nov 16, 2017 |
| Grant date | Jun 7, 2022 |
| Priority date | — |
| Expiry date | Nov 16, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05B45/12
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The present invention relates to a measurement arrangement for detecting aging processes in individual light-emitting diodes which makes it possible to identify, and subsequently to compensate, a loss of brightness in light-emitting diodes. In this context, a relative measurement of brightness intensity is taken. The present invention further relates to a correspondingly set-up method for detecting aging processes in individual light-emitting diodes and to a computer program product comprising control commands which implement the method.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.