Diagnostic model optimization for variations in mechanical components of imaging devices
US11357396B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 24, 2020 |
| Grant date | Jun 14, 2022 |
| Priority date | — |
| Expiry date | Jun 19, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/03
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Introduced here are diagnostic platforms able to optimize computer-aided diagnostic (CADx) models by simulating the optical performance of an imaging device based on its mechanical components. For example, a diagnostic platform may acquire a source image associated with a confirmed diagnosis of a medical condition, simulate optical performance based on design data corresponding to a virtual prototype of the imaging device, generate a training image by altering the source image based on the optical performance, apply a diagnostic model to the training image, and then determine whether the performance of the diagnostic model meets a specified performance threshold. If the diagnostic model fails to meet the specified performance threshold, the diagnostic platform can automatically optimize the diagnostic model for the imaging device by altering its underlying algorithm(s).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.