Systems and methods for in-situ cure monitoring and defect detection
US11360053B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Dec 2, 2019 |
| Grant date | Jun 14, 2022 |
| Priority date | — |
| Expiry date | Jul 27, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/02827
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Non-destructive evaluation (NDE) systems and methods are provided for monitoring objects being manufactured during a cure or consolidation process and for detecting defects that occur during the cure or consolidation process or to detect conditions of the process that can lead to the occurrence of defects. Information acquired by the NDE system during the cure or consolidation process can be used to adjust one or more parameters of the process in real-time to prevent defects from occurring or to reduce the number and/or severity of defects that occur during the cure or consolidation process.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.