Patent · US Active

Deep learning model used for image recognition and training apparatus of the model and method thereof

US11361190B2 · kind B2 · utility

0Cited by

3References

16Claims

0Family size

Assignee

FUJITSU LIMITED · JP

Inventors

Rui Yin · Hangzhou City, CN
Zhiming Tan · Beijing, CN

Key dates

Filing date	Oct 16, 2019
Grant date	Jun 14, 2022
Priority date	—
Expiry date	Jun 29, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG06V10/82
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Embodiments of this disclosure provide a deep learning model used for image recognition and apparatus and method thereof. The model includes a determination layer configured to determine whether features in feature maps are features of positions where objects of attention are located, and different weights are granted for the positions where the objects of attention are located and other features in performing weight and composition processing on the features. Hence, the model may be guided to be focused on attention features and make correct determination, thereby improving performance and precision of the model.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.