Multi-stage machine learning-based chain diagnosis
US11361248B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 16, 2019 |
| Grant date | Jun 14, 2022 |
| Priority date | — |
| Expiry date | Apr 16, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N7/01
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Various aspects of the disclosed technology relate to machine learning-based chain diagnosis. Faults are injected into scan chains in a circuit design. Simulations are performed on the fault-injected circuit design to determine observed failing bit patterns. Bit-reduction is performed on the observed failing bit patterns to construct first training samples. Using the first training samples, first-level machine-learning models are trained. Affine scan cell groups are identified. Second training samples are prepared for each of the affine scan cell groups by performing bit-filtering on a subset of the observed failing bit patterns associated with the faults being injected at scan cells in the each of the affine scan cell groups. Using the second training samples, second-level machine-learning models are trained. The first-level and second-level machine learning models can be applied in a multi-stage machine learning-based chain diagnosis process.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.