Method for mapping crop yields
US11361256B2 · kind B2 · utility
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3References
20Claims
0Family size
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Key dates
| Filing date | Jul 20, 2020 |
| Grant date | Jun 14, 2022 |
| Priority date | — |
| Expiry date | Aug 4, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V20/188
- WIPO fieldIT methods for management
- WIPO sectorElectrical engineering
Abstract
Systems and methods for generating crop yield maps are provided. In one example embodiment, a method comprises accessing data indicative of crop yield for a field area; accessing one or more data types associated with the field area, each of the data types providing a geospatial distribution of data associated with vegetation across the field area; determining a crop yield distribution for the field area; and generating a yield map for the field area based at least partially on the crop yield distribution.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.