Artificial intelligence-based process and system for visual inspection of infrastructure
US11361423B2 · kind B2 · utility
2Cited by
2References
13Claims
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Key dates
| Filing date | Jun 17, 2020 |
| Grant date | Jun 14, 2022 |
| Priority date | — |
| Expiry date | Aug 7, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30184
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An artificial intelligence (AI) based system for detecting defects in infrastructure uses an image recognizer and image data. A set of annotated training and validation data is generated to train and validate the image recognizer. The image data is annotated with classification data such as defect type and severity of the defect. Once trained and validated, the image recognizer can analyze inspection images to identify detects therein and generate an output report including the identification and classification of the defect, and remediation recommendations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.