Techniques for analyzing and detecting executional artifacts in microwell plates
US11361438B2 · kind B2 · utility
2Cited by
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20Claims
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Key dates
| Filing date | Jul 27, 2020 |
| Grant date | Jun 14, 2022 |
| Priority date | — |
| Expiry date | Jul 27, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30242
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In various embodiments, an experiment analysis application detects executional artifacts in experiments involving microwell plates. The experiment analysis application computes one or more sets of spatial features based on one or more heat maps associated with a microwell plate. The experiment analysis application then aggregates the set(s) of spatial features to generate a feature vector. The experiment analysis application inputs the feature vector into a trained classifier. In response, the trained classifier generates a label indicating that the microwell plate is associated with a first executional artifact.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.