Patent · US Active

Ultrasonic flaw detector test block

US11366084B2 · kind B2 · utility

0Cited by

1References

9Claims

0Family size

Assignee

NANJING DEVELOP ADVANCED MANUFACTURING CO., LTD. · CN

Inventors

Changhua Chen · San Jose, US
Li Zhang · Suzhou, CN
Hong Mei Zhang · Beijing, CN
Zhengmao Xu · 安丰镇, CN
Zheng Dong · 安丰镇, CN
Qingyong Chen · Zhaoyuan, CN
Xiaolei Liu · Los Angeles, US
Yao Ha · Nanjing, CN

Key dates

Filing date	Oct 9, 2018
Grant date	Jun 21, 2022
Priority date	—
Expiry date	Oct 9, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG01N29/30
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A dudou-shaped test block includes a testing structure, a first beam-path structure, and a second beam-path structure. A first arc-shaped groove and a second arc-shaped groove are provided on one side of the testing structure. The other side of the testing structure is a flat surface. The first beam-path structure and the second beam-path structure are both flat plates. A thickness of the first beam-path structure is less than a thickness of the second beam-path structure. The first beam-path structure and the second beam-path structure are both in contact with the flat surface and arranged parallel to the flat surface. The first arc-shaped groove is arranged corresponding to the first beam-path structure, and the second arc-shaped groove is arranged corresponding to the second beam-path structure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.