Dual-sensor tool optical data processing through master sensor standardization
US11366247B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 21, 2020 |
| Grant date | Jun 21, 2022 |
| Priority date | — |
| Expiry date | Nov 20, 2040 |
Classification
- Technology area (CPC E)Fixed Constructions
- CPC primaryE21B49/0875
- WIPO fieldCivil engineering
- WIPO sectorOther fields
Abstract
A method may include transforming optical responses for a fluid sample to a parameter space of a downhole tool. The optical responses are obtained using a first operational sensor and a second operational sensor of the downhole tool. Fluid models are applied in the parameter space of the downhole tool to the transformed optical responses to obtain density predictions of the fluid sample. The density predictions of the first operational sensor are matched to the density predictions of the second operational sensor based on optical parameters of the fluid models to obtain matched density predictions. A difference between the matched density predictions and measurements obtained from a densitometer is calculated, and a contamination index is estimated based on the difference.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.