Stimulated emission depletion super-resolution microscope using quick combination of light beams
US11366300B2 · kind B2 · utility
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Key dates
| Filing date | Oct 12, 2020 |
| Grant date | Jun 21, 2022 |
| Priority date | — |
| Expiry date | Jan 5, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/0076
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A STED super-resolution microscope capable of quick beam combination is disclosed, which includes a STED imaging unit and a beam combination test unit. The excitation light and the depletion light are accurately combined by the beam combination test unit, so that the imaging light spots of the two light beams passing through the STED imaging unit can accurately coincide with each other, thereby obtaining a better super-resolution imaging effect.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.