Patent · US Active

Stimulated emission depletion super-resolution microscope using quick combination of light beams

US11366300B2 · kind B2 · utility

0Cited by
0References
5Claims
0Family size

Assignees

Inventors

Key dates

Filing dateOct 12, 2020
Grant dateJun 21, 2022
Priority date
Expiry dateJan 5, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B21/0076
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A STED super-resolution microscope capable of quick beam combination is disclosed, which includes a STED imaging unit and a beam combination test unit. The excitation light and the depletion light are accurately combined by the beam combination test unit, so that the imaging light spots of the two light beams passing through the STED imaging unit can accurately coincide with each other, thereby obtaining a better super-resolution imaging effect.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.