Patent · US Active

Layout analysis

US11367296B2 · kind B2 · utility

0Cited by
2References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 17, 2021
Grant dateJun 21, 2022
Priority date
Expiry dateJun 17, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06V2201/131
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A layout analysis method, an electronic device, and a non-transitory computer-readable storage medium are provided. The layout analysis method includes: obtaining coordinate information of a plurality of text lines in an image; creating a layout model of the image according to the coordinate information; analyzing a layout structure of the text lines based on the layout model; and determining an order of the text lines relative to each other based on the layout structure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.