Patent · US Active

Impedance calibration circuit and method of calibrating impedance in memory device

US11367471B2 · kind B2 · utility

1Cited by
9References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 21, 2021
Grant dateJun 21, 2022
Priority date
Expiry dateJun 21, 2041

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B69/00
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An impedance calibration circuit includes a first variable impedance, a second variable impedance, a third variable impedance. The first variable impedance is connected to a ZQ terminal. A first control circuit performs a first impedance calibration on the first variable impedance based on an output signal from an output of a first comparator. A second control circuit performs a second impedance calibration on the third variable impedance based on an output signal from an output of a second comparator. A first switch connects an input of the first comparator to one of the ZQ terminal and the first node. A second switch connects the output of the first comparator to one of the first and second control circuits. A third switch connects an output of the first switch to one of first and second input terminals of the first comparator and connects the reference voltage to the other.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.