Amplitude and biphase control of MEMS scanning device
US11368658B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 15, 2020 |
| Grant date | Jun 21, 2022 |
| Priority date | — |
| Expiry date | Sep 12, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N9/3194
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A MEMS scanning device (“Device”) includes at least (1) laser projector(s) controlled by a laser drive to project a laser beam, (2) MEMS scanning mirror(s) controlled by a MEMS drive to scan the laser beam to generate a raster scan, (3) a display configured to receive the raster scan, (4) a thermometer configured to detect a current temperature, (5) a display observing camera configured to capture an image of a predetermined area of the display, and (6) a computer-readable media that stores temperature model(s), each of which is custom-built using machine learning. The device uses the display observing camera to capture image(s) of predetermined pattern(s), which are then used to extract feature(s). The extracted feature(s) are compared with ideal feature(s) to identify a discrepancy. When the identified discrepancy is greater than a threshold, the temperature model(s) are updated accordingly.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.