Short-wave infrared and 3D topographic imager
US11369269B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 23, 2019 |
| Grant date | Jun 28, 2022 |
| Priority date | — |
| Expiry date | Aug 27, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30036
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for acquiring images of a sample are provided. According to an aspect of the invention, a system includes a first light source that emits first light having a first wavelength as a temporally continuous beam; a second light source that emits second light having a second wavelength as a temporally modulated beam; and a scanning mirror that raster scans the first light across a sample during a raster scan period, and projects a structured light pattern of the second light onto the sample during the raster scan period. A first image of the sample is generated from at least a portion of the first light that is backscattered from the sample during the raster scan period, and a second image of the sample is generated from at least a portion of the second light that is backscattered from the sample during the raster scan period.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.