Freeform surface reflective infrared imaging system
US11371889B2 · kind B2 · utility
1Cited by
7References
16Claims
0Family size
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Key dates
| Filing date | Jun 29, 2020 |
| Grant date | Jun 28, 2022 |
| Priority date | — |
| Expiry date | Jan 5, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2005/0077
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a freeform surface reflective infrared imaging system comprising a primary mirror, a secondary mirror, a tertiary mirror, and an infrared light detector. Each reflective surface of the primary mirror, the secondary mirror, and the tertiary mirror is an xy polynomial freeform surface. A field of view of the freeform surface reflective infrared imaging system is larger than or equal to 40°×30°. An F-number of the freeform surface reflective infrared imaging system is less than or equal to 1.39.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.