Print defect detection mechanism
US11373294B2 · kind B2 · utility
2Cited by
16References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 28, 2020 |
| Grant date | Jun 28, 2022 |
| Priority date | — |
| Expiry date | Jan 29, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30176
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method is disclosed. The method includes receiving one or more images of bitmap data applied to a print medium as print medium image data, register the print medium image data to the bitmap data, detecting one or more candidate defects based on whether a difference between the print medium image data at a location and the bitmap data at the location exceeds a predetermined threshold, detecting one or more defects among the candidate defects and transmitting information about the one or more candidate defects classified as defects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.