Conductive particles and test socket having the same
US11373779B2 · kind B2 · utility
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13Claims
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Assignee
Inventor
Key dates
| Filing date | Jun 9, 2021 |
| Grant date | Jun 28, 2022 |
| Priority date | — |
| Expiry date | Jun 9, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05K2201/0379
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Proposed is a conductive particle used for a testing socket electrically connecting a lead of a device to be tested and a pad of a test board by being arranged between the device to be tested and the test board, wherein the conductive particle has a predetermined depth d and has a length l that is greater than a width w, the conductive particle having a body part in a pillar shape, a first convex part having an upper surface, formed in a top of the body part, and a second convex part having a lower surface, formed in a bottom of the body part.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.