Apparatus for measuring surface profile of normal and shear stress
US11378477B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Sep 25, 2018 |
| Grant date | Jul 5, 2022 |
| Priority date | — |
| Expiry date | Dec 11, 2038 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA43B17/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for measuring normal and shear stress at a surface. The apparatus includes a substrate; and a plurality of sensing units on the substrate. Each sensing unit includes a mechanical transducer having a receiving surface and a sensing surface; and a plurality of normal force sensors between the sensing surface and the substrate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.