Patent · US Active

Analytical methods using X-ray absorption spectroscopy for quantifying or evaluating metal ions in a dentifrice

US11378529B2 · kind B2 · utility

0Cited by
31References
20Claims
0Family size

Assignees

Inventors

Key dates

Filing dateDec 29, 2020
Grant dateJul 5, 2022
Priority date
Expiry dateDec 29, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/8918
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The disclosure contains a method of quantifying and/or evaluating metal ions in a dentifrice, wherein the method comprises subjecting the dentifrice to X-ray absorption spectroscopy (XAS), and wherein the XAS is used to measure and/or evaluate the metal ions in the dentifrice. Also disclosed are methods of selecting and screening for dentifrices based upon the evaluation and quantification of their metal ion content.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.