Patent · US Active

Data-analysis-based facility for adjusting trace fields of a database trace

US11379444B1 · kind B1 · utility

1Cited by

4References

20Claims

0Family size

Assignee

International Business Machines Corporation · US

Inventors

Xiaobo Wang · San Diego, US
Shuo Li · Beijing, CN
Leilei Li · San Jose, US
Akiko Hoshikawa · San Jose, US
Sheng Yan Sun · Beijing, CN

Key dates

Filing date	Jan 28, 2021
Grant date	Jul 5, 2022
Priority date	—
Expiry date	Jan 28, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG06F2201/80
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Trace processing in a database system is facilitated by obtaining database trace data collected from database tracing a database system, and data analyzing, by one or more processors, the database trace data to determine one or more field-related rules to, in part, reduce impact on system performance of database tracing in the database system. Trace processing is further facilitated by applying the one or more field-related rules to a database trace in the database system to adjust trace fields of the database trace according to the one or more field-related rules, thereby reducing impact on system performance of the database trace in the database system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.