Analyzing tags associated with high-latency and error spans for instrumented software
US11379475B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 24, 2020 |
| Grant date | Jul 5, 2022 |
| Priority date | — |
| Expiry date | Sep 27, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/835
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A computer-implemented method for analyzing spans and traces associated with a microservices-based application executing in a distributed computing environment comprises aggregating a plurality of ingested spans associated with one or more applications executing in the distributed computing environment into a plurality of traces, wherein each of the plurality of ingested spans is associated with a plurality of tags. The method further comprises comparing durations of a set of related traces of the plurality of traces to determine patterns for the plurality of tags and generating a histogram that represents a distribution of the durations of the set of related traces. The method also comprises providing alerts for one or more tags from the plurality of tags associated with traces having a duration above a threshold based on the distribution of the durations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.